Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects

Cover Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects
Sensitivity of Two Beam Transmission Electron Microscope Images to the Structure of Small Crystal Defects
Sykes, Lawrence Joseph
Typescript Thesis (Ph. D.) --University of Florida, 1981 Vita Bibliography: leaves 220-224 MATERIALS SCIENCE AND ENGINEERING Ph. D psb

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